Fault Zone Dynamic Processes: Evolution of Fault Properties During Seismic Rupture
| By: | Marion Y. Thomas; Thomas M. Mitchell; Harsha S. Bhat |
| Publisher: | Wiley Global Research (STMS) |
| Print ISBN: | 9781119156888 |
| eText ISBN: | 9781119156901 |
| Edition: | 1 |
| Format: | Reflowable |
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