Process Control System Fault Diagnosis: A Bayesian Approach
| By: | Ruben Gonzalez; Fei Qi; Biao Huang |
| Publisher: | Wiley Global Research (STMS) |
| Print ISBN: | 9781118770610 |
| eText ISBN: | 9781118770597 |
| Edition: | 1 |
| Format: | Reflowable |
eBook Features
Instant Access
Purchase and read your book immediately
Read Offline
Access your eTextbook anytime and anywhere
Study Tools
Built-in study tools like highlights and more
Read Aloud
Listen and follow along as Bookshelf reads to you
Details
Table of Contents